Research

On one hand we investigate surface and interface properties at the nanometer scale with focus on scanning probe microscopy techniques, like STM, AFM and SNOM to name only the most common ones. Furthermore, self-assembly techniques are employed to create nanoscale patterns and structures. Please choose from the left menu to obtain more details on the specific research projects.

snom_instrument_1

 

Picture from the SNOM Research-Group


Imprint | © 2008 Physikalisches Institut - AG Fuchs
Physikalisches Institut - AG Fuchs
Wilhelm-Klemm-Str. 10 · D-48149 Münster
Tel.: +49 251 83-33621 · Fax: +49 251 83-33602