Forschungsbericht 1999-2000   
WWU-Logo Institut für Materialphysik
(ehemals Institut für Metallforschung)

Wilhelm-Klemm-Str. 10
48149 Münster
Tel. (0251) 83-3 35 71
Fax: (0251) 83-3 83 46
e-mail: mehrer@nwz.uni-muenster.de
WWW: http://www.uni-muenster.de/Physik/MF

Geschäftsführender Direktor: Prof. Dr. H. Mehrer

 
 
 
[Pfeile  gelb] Forschungsschwerpunkte 1999 - 2000
Fachbereich 11 - Physik
Institut für Materialphysik
Diffusion in Metals, Intermetallics, and Silicides
 


Diffusion in iron silicides

Diffusion of silicon and germanium in the D03 phase of the system Fe-Si has been studied. As there is no radioactive Si isotope for detailed self-diffusion studies the rare stable isotope 30Si was used. Tracer deposition was done by ion implantation. Profiles were analysed by means of secondary ion mass spectrometry (SIMS). In a preceding study the radioisotope 71Ge served as a substitute for Si. One experiment with the short-lived 31Si showed very similar diffusion rates for Si and Ge, so that the approach of using the homologous element seemed to be appropriate. As a check for this approach we also performed diffusion experiments with the stable isotope 74Ge in analogy to those with 30Si. The obtained data confirms the strong asymmetry between the diffusion of majority and minority constituents in D03 phases. The data also shows the homology of Ge and Si. Finally this demonstrates that radiotracer methods and SIMS technique can be successfully combined in order to cover a large temperature interval.

Self-diffusion of Fe and diffusion of Ge in the B20 phase FeSi have been studied as a function of temperature using the radiotracer method. Ge has been used to simulate Si self-diffusion. Both diffusivities are very small, and their values for Fe are about one to two orders of magnitude smaller than for Ge. This uncoupled diffusion may be explained by vacancy-based diffusion on the Fe and Si sublattices. Both diffusivities reach a value of about 10-14m2s-1 near the melting temperature which is more typical for semiconductors than for metals. Results are discussed in comparison with other diffusion data on phases of the Fe-Si system and on other transition metal silicides.

Drittmittelgeber:

Deutsche Forschungsgemeinschaft

Beteiligte Wissenschaftler:

Dr. H. Baumann (Universität Frankfurt), Prof. Dr. G. Borchardt (TU Clausthal), Dr. P. Fielitz (TU Clausthal), Prof. Dr. H. Mehrer (Leiter), Dipl.-Phys. M. Salamon, Dr. B. Sepiol (Universität Wien), Dr. S. Scherrer (École des Mines, Nancy/Frankreich), Dr. S. Weber (École des Mines, Nancy/Frankreich), Dr. M. Wellen (TU Clausthal)

Veröffentlichungen:

Salamon, M., H. Mehrer: Diffusion in the B20-type phase FeSi, Phil. Mag. A 79, 2137 - 2155 (1999)

Wellen, M., P. Fielitz, G. Borchardt, S. Weber, S. Scherrer, H. Mehrer, H. Baumann, B. Sepiol: Diffusion of Si and Ge in the intermetallic phase Fe3Si: ion implantation and SIMS studies, Mat. Sci. Forum, in print

 
 
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Hans-Joachim Peter
EMail: vdv12@uni-muenster.de
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Informationskennung: FO11GA04
Datum: 2001-05-21