Oberflächenphysik

Die Wechselwirkung von Ionen, Elekronen und Photonen mit Festkörperoberflächen, insbesondere auch mit molekularen Oberflächenstrukturen werden mit modernen spektroskopischen Verfahren wie z.B. der Sekundärionen-Massenspektrometrie, der resonanten und nichtresonanten Sekundärneutralteilchen-Massenspektrometrie, der Ionenrückstreuung, der Thermischen Desorptions-Massenspektrometrie und der Auger- und Photoelektronenspektroskopie untersucht.

Drittmittelgeber:

BMBF, DFG, Fonds der Chemischen Industrie, Fraunhofer-Gesellschaft, Land NRW

Beteiligte Wissenschaftler:

Prof.Dr. H.F. Arlinghaus, Prof.Dr. A. Benninghoven, Dipl.-Phys. O. Brox, Dipl.-Phys. B. Burkhardt, Dr. G. Egbers, Dipl.-Phys. M. Fartmann, Dipl.-Phys. T. Fladung, Dipl.-Phys. T. Gantenfort, Dipl.-Phys. T. Grehl, Dr. K. Iltgen, Dipl.-Phys. R. Kamischke, Dipl.-Phys. R. Kersting, Dipl.-Phys. F. Kollmer, Dr. D. Lipinsky, Dr. K. Meyer, Dr. D. Rading, Dr. H. Rulle, Dipl.-Phys. A. Schnieders, Dr. F. Schröder-Oeynhausen, Dr. B.-C. Schwede, Dr. W. Sichtermann, Dipl.-Phys. D. Stapel, Dipl.-Phys. J. Steinhoff, Dipl.-Phys. D. Ströker, Dr. L. Wiedmann, Dr. D. Wolany, Dr. A. Zehnpfenning

Veröffentlichungen:

Rulle, H., D. Rading, A. Benninghoven: Imaging TOF-SIMS of Molecular Overlayers : Limits of Lateral Resolution, In : Secondary Ion Mass Spectrometry (SIMS X), A. Benninghoven, B. Hagenhoff, H. W. Werner (Eds), Wiley & Sons, p. 153, 1997

Lipinsky, D., L. Wiedmann, A. Benninghoven: Oxides in Sputter Equilibrium and Depth Profile Analysis of Metal Oxide Multilayer Systems, In : Secondary Ion Mass Spectrometry (SIMS X), A. Benninghoven, B. Hagenhoff, H. W. Werner (Eds), Wiley & Sons, p. 235, 1997

Nicholas, M., R. W. Linton, R. M. Friedman, D. Rading, A. Benninghoven: Applications of Classification and Calibration Methods to Time-of-Flight Secondary Ion Mass Spectra of Organic Materials, In : Secondary Ion Mass Spectrometry (SIMS X), A. Benninghoven, B. Hagenhoff, H. W. Werner (Eds), Wiley & Sons, p. 317, 1997

Schröder-Oeynhausen, F., B. Burkhardt, T. Fladung, L. Wiedmann, A. Benninghoven: Depth Profile Analysis of GaAs-Oxide Layers with SIMS, e-Beam SNMS and ARXPS, In : Secondary Ion Mass Spectrometry (SIMS X), A. Benninghoven, B. Hagenhoff, H. W. Werner (Eds), Wiley & Sons, p. 351, 1997

Iltgen, K., C. Bendel, E. Niehuis, A. Benninghoven: TOF-SIMS Depth-Profiling with a Dual-Beam Technique, In : Secondary Ion Mass Spectrometry (SIMS X), A. Benninghoven, B. Hagenhoff, H. W. Werner (Eds), Wiley & Sons, p. 375, 1997

Deimel, M., D. Rading, G. Egbers, E. Göcke, A. Benninghoven: Temperature Programmed TOF-SIMS : Investigation of Si Wafer Surfaces, In : Secondary Ion Mass Spectrometry (SIMS X), A. Benninghoven, B. Hagenhoff, H. W. Werner (Eds), Wiley & Sons, p. 507, 1997

Rading, D., G. Becker, H. Rulle, V. Liebing, M. Mört, H. Fuchs, A. Benninghoven : Combined SIMS/SEM/SFM Investigation of Damage Effects in Molecular Overlayers, In : Secondary Ion Mass Spectrometry (SIMS X), A. Benninghoven, B. Hagenhoff, H. W. Werner (Eds), Wiley & Sons, p. 619, 1997

Stoppek-Langner, K., J. Grobe, B. Hagenhoff, K. Meyer, A. Benninghoven Time-of-Flight SIMS Studies on Alkylpolysiloxane Layers - SiO-Frameworks with Polyhedral, Ladder and Ring Structures -, In : Secondary Ion Mass Spectrometry (SIMS X), A. Benninghoven, B. Hagenhoff, H. W. Werner (Eds), Wiley & Sons, p. 627, 1997

Reihs, K., K. Kircher, M. Voetz, M. Deimel, F.M. Petrat, D. Wolany, A. Benninghoven: Molecular Weight Determination of Bulk Polymer Surfaces by Static SIMS, In : Secondary Ion Mass Spectrometry (SIMS X), A. Benninghoven, B. Hagenhoff, H. W. Werner (Eds), Wiley & Sons, p. 641, 1997

Licciardello, A., C. Puglisi, D. Lipinsky, E. Niehuis, A. Benninghoven: Time-of-Flight SIMS Characterization of Nylon-6/Polycarbonate Blends, In : Secondary Ion Mass Spectrometry (SIMS X), A. Benninghoven, B. Hagenhoff, H. W. Werner (Eds), Wiley & Sons, p. 711, 1997

Reihs, K., H. Rulle, M. Deimel, A. Benninghoven: Correlation of Adhesion and Molecular Surface Structures of Technical Polymers, In : Secondary Ion Mass Spectrometry (SIMS X), A. Benninghoven, B. Hagenhoff, H. W. Werner (Eds), Wiley & Sons, p. 715, 1997

Petrat, F.M., D. Wolany, K. Reihs, L. Wiedmann, A. Benninghoven: In Situ TOF-SIMS and XPS Studies of SF Plasma Treated Polycarbonate Surfaces and Adhesion of Al on Polycarbonate, In : Secondary Ion Mass Spectrometry (SIMS X), A. Benninghoven, B. Hagenhoff, H. W. Werner (Eds), Wiley & Sons, p. 723, 1997

Deimel, M., H. Rulle, V. Liebing, A. Benninghoven: Investigation of the Surface Diffusion Behaviour of Polymers on Metal Surfaces Using Imaging TOF-SIMS, In : Secondary Ion Mass Spectrometry (SIMS X), A. Benninghoven, B. Hagenhoff, H. W. Werner (Eds), Wiley & Sons, p. 755, 1997

Egbers, G., D. Rading, K. Stoppek.Langner, J. Grobe, A. Benninghoven: Analysis of Silane-SA-Monolayers on Si-Surfaces by Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS), In : Secondary Ion Mass Spectrometry (SIMS X), A. Benninghoven, B. Hagenhoff, H. W. Werner (Eds), Wiley & Sons, p. 763, 1997

Schnieders, A., R. Möllers, A. Benninghoven, K. Reihs: Rotational, Vibrational, and Kinetic Excitation of Sputtered Nitric Oxide and NO2-Containing Molecules, In : Secondary Ion Mass Spectrometry (SIMS X), A. Benninghoven, B. Hagenhoff, H. W. Werner (Eds), Wiley & Sons, p. 775, 1997

Merschel, L., W. Sichtermann, N. Buschmann, A. Benninghoven: Identification of Organic Molecules in Thin Layer Chromatography by TOF-SIMS, In : Secondary Ion Mass Spectrometry (SIMS X), A. Benninghoven, B. Hagenhoff, H. W. Werner (Eds), Wiley & Sons, p. 787, 1997

Meyer, K., A. Benninghoven, M. Fobker, M. Erren, G. Assmann, U. Christians, K.-F. Sewing : Determination of Cyclosporin Metabolites by TOF-SIMS, In : Secondary Ion Mass Spectrometry (SIMS X), A. Benninghoven, B. Hagenhoff, H. W. Werner (Eds), Wiley & Sons, p. 851, 1997

Möllers, R., A. Schnieders, G. Kortenbruck, A. Benninghoven: Sputtering of Organic Molecules : vt.Comparison of Secondary Neutral and Ion Emission, In : Secondary Ion Mass Spectrometry (SIMS X), A. Benninghoven, B. Hagenhoff, H. W. Werner (Eds), Wiley & Sons, p. 943, 1997

Leufgen, K.M., H. Rulle, H.-J. Galla, M. Sieber, A. Benninghoven: Imaging of Coexisting Phases in Langmuir-Blodgett Layers by TOF-SIMS, In : Secondary Ion Mass Spectrometry (SIMS X), A. Benninghoven, B. Hagenhoff, H. W. Werner (Eds), Wiley & Sons, p. 957, 1997

Deimel, M., B. Hagenhoff, A. Benninghoven: Temperature Programmed Static SIMS : Investigations of Polymer Monolayers on Metal Surfaces, In : Secondary Ion Mass Spectrometry (SIMS X), A. Benninghoven, B. Hagenhoff, H. W. Werner (Eds), Wiley & Sons, p. 961, 1997

Kötter, F., A. Benninghoven: Time-of-Flight Mass Spectrometry of Sputtered Neutrals After Electron Beam Postionization, In : Secondary Ion Mass Spectrometry (SIMS X), A. Benninghoven, B. Hagenhoff, H. W. Werner (Eds), Wiley & Sons, p. 1011, 1997

Iltgen, K., C. Bendel, A. Benninghoven, E. Niehuis: Optimized time-of-flight secondary ion mass spectroscopy depth profiling with a dual beam technique, Journal Vac. Sci. Technol. A, 15(3), 460, 1997

Cullen, P., M. Fobker, K. Tegelkamp, K. Meyer, F. Kannenberg, A. Cignarella, A. Benninghoven, G. Assmann: An improved method for quantification of cholesterol and cholesteryl esters in human monocyte-derived macrophages by high performance liquid chromatography with identification of unassigned cholesteryl ester species by means of secondary ion mass spectrometry, Journal of Lipid Research 38, 401, 1997

Iltgen, K., O. Brox, A. Benninghoven, E. Niehuis: Ultra Shallow Depth Profiling by TOF-SIMS : Investigation of the Transient Region, In : Secondary Ion Mass Spectrometry (SIMS XI), G. Gillen, R. Lareau, J. Bennett, F. Stevie (Eds), Wiley & Sons, p. 305, 1998

Iltgen, K., A. Benninghoven, E. Niehuis: TOF-SIMS Depth Profiling with Optimized Depth Resolution, In : Secondary Ion Mass Spectrometry (SIMS XI), G. Gillen, R. Lareau, J. Bennett, F. Stevie (Eds), Wiley & Sons, p. 367, 1998

Rading, D., R. Kersting, A. Benninghoven: Secondary Ion Emission from Molecular Overlayers : Thiols on Gold, In : Secondary Ion Mass Spectrometry (SIMS XI), G. Gillen, R. Lareau, J. Bennett, F. Stevie (Eds), Wiley & Sons, p. 455, 1998

Kötter, F., E. Niehuis, A. Benninghoven: Secondary Ion Emission from Polymer Surfaces Under Ar⁺, Xe⁺, and SF₅⁺ Primary Ion Bombardment, In : Secondary Ion Mass Spectrometry (SIMS XI), G. Gillen, R. Lareau, J. Bennett, F. Stevie (Eds), Wiley & Sons, p. 459, 1998

Wolany, D., L. Duda, T. Fladung, J. W. Lee, T. Gantenfort, L. Wiedmann, A. Benninghoven : Combined TOF-SIMS/XPS Study of Plasma Modification and Metallization of Polyimide, In : Secondary Ion Mass Spectrometry (SIMS XI), G. Gillen, R. Lareau, J. Bennett, F. Stevie (Eds), Wiley & Sons, p. 485, 1998

Rading, D., V. Liebing, G. Becker, M. Mört, H. Fuchs, A. Benninghoven: Investigation of Electron Induced Damaging of Molecular Overlayers by Imaging TOF-SIMS, In : Secondary Ion Mass Spectrometry (SIMS XI), G. Gillen, R. Lareau, J. Bennett, F. Stevie (Eds), Wiley & Sons, p. 501, 1998

Schwede, B.-C., T. Heller, D. Rading, E. Niehuis, B. Hagenhoff, L. Wiedmann, A. Benninghoven: The Münster High Mass Resolution Static SIMS Library, In : Secondary Ion Mass Spectrometry (SIMS XI), G. Gillen, R. Lareau, J. Bennett, F. Stevie (Eds), Wiley & Sons, p. 509, 1998

Egbers, G., K. Hackling, A. Benninghoven: Temperature Programmed Static SIMS Investigation of Ag and Si Surfaces, In : Secondary Ion Mass Spectrometry (SIMS XI), G. Gillen, R. Lareau, J. Bennett, F. Stevie (Eds), Wiley & Sons, p. 549, 1998

Hagenhoff, B., P. L. Cobben, C. Bendel, E. Niehuis, A. Benninghoven: Polymers under SF₅⁺ Bombardment - a Systematic Investigation, In : Secondary Ion Mass Spectrometry (SIMS XI), G. Gillen, R. Lareau, J. Bennett, F. Stevie (Eds), Wiley & Sons, p. 585, 1998

Schnieders, A., F. Kollmer, A. Benninghoven: Fundamental Investigations with Imaging Laser-SNMS, In : Secondary Ion Mass Spectrometry (SIMS XI), G. Gillen, R. Lareau, J. Bennett, F. Stevie (Eds), Wiley & Sons, p. 661, 1998

Verlinden, G., R. Gijbels, I. Geuens, A. Benninghoven: Imaging Time-of-Flight SIMS (TOF-SIMS) Surface Analysis of Halide Distributiuons in Complex Silver Halide Microcrystals, In : Secondary Ion Mass Spectrometry (SIMS XI), G. Gillen, R. Lareau, J. Bennett, F. Stevie (Eds), Wiley & Sons, p. 871, 1998

Kötter, F., A. Benninghoven: Secondary Ion Emission from Molecular Surfaces under Ar⁺, Xe⁺ and SF₅⁺ Ion bombardment, Appl. Surf. Sci. 33, 47, 1998

Deimel, M., H. Rulle, V. Liebing, A. Benninghoven: Study of molecular surface diffusion by imaging static secondary ion mass spectrometry (SIMS) : polymers on Ag-surfaces, Appl. Surf. Sci. 134, 271, 1998

Rading, D., V. Liebing, G. Becker, H. Fuchs, A. Benninghoven: Investigation of Electron Induced Damaging of Molecular Overlayers by Imaging Static TOF-SIMS, Journal Vac. Sci. Technol. A, 16(6), 3449, 1998

Sperveslage, G., J. Grobe, G. Egbers, A. Benninghoven: Porous silicon : repeatability of generation? Fresenius J. Anal. Chem. 361, 554, 1998