Victor Isakov (Wichita State): On the inverse doping profile problem for semiconductors

Montag, 25.05.2009 14:15
Mathematik und Informatik

We consider the problem of determining doping profile in semiconductors from standard voltage boundary measurements. We derive a dual inverse problem, obtain its asymptotic simplification (for large contrast of conductivities), and prove first uniqueness results in the important unipolar case.

Angelegt am Sonntag, 03.05.2009 13:05 von mburg_01
Geändert am Montag, 04.05.2009 22:39 von mburg_01
[Edit | Vorlage]

Oberseminar Angewandte Mathematik