Welcome to Nanomechanics
The atomic force microscope as a surface analytical tool.
Our research is focused towards the analysis of surface properties with atomic force microscope (AFM). While the AFM is very successful in imaging surfaces even with atomic resolution, there is even more information which can be obtained from analysing the forces between the AFM tip and the surface. From the different type of interaction forces (electrostatic, magnetic, chemical, ...), we can learn a lot about the physical mechanisms governing nanoscale contacts.
For example the quantitative measurement of forces of functionalized tips and surfaces can be exploited to measure the adhesion properties of metallic films on polymers (see Nano-Adhesion-Sensor project). In the dynamic operational mode the tip-sample interactions may lead to a loss of oscillation energy. These fundamental energy dissipation mechanisms are investigated with our variable temperature AFM. Another way of measuring energy dissipation of nanoscale contacts is by using the friction force microscope, where nanoscale friction is investigated.
Last but not least, the AFM is used to investigate the conductivity properties of solid ion conductors by measuring the electrical forces as a function of time. The Nano-Ionics project is a joint effort with the groups of Bernhard Roling at the University of Marburg and Hartmut Bracht at the University of Münster. Please click on the "Research" button for more detailed information on the current research projects.
The Nanomechanics consists of the following coworkers:
Dr. Lars Jansen
Oscar Diaz Arado
Jens Falter
Gernot Langewisch
Johannes Sondhauß
Marvin Stiefermann
Research activities of the nanomechanics group projects: click here
