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AG Schmitz Institut für Materialphysik
Wilhelm-Klemm-Straße 10 48149 Münster
Tel.: 0251 83-33572
Fax: 0251 83-38346
gschmitz@uni-muenster.de

Metanavigation: 


1991 - 1999 2000 - 2004 2005 - 2009 2010 - 2011 2012
2012
D. Bresser, E. Paillard, R. Kloepsch, S. Krueger, M. Fiedler, R. Schmitz, D. Baither, M. Winter, S. Passerini,
Carbon Coated ZnFe2O4 Nanoparticles for Advanced Lithium-Ion Anodes,
Adv. Energy Mater. 3, 513 (2012)
doi:10.1002/aenm.201200735
126 M. Timpel, N. Wanderka,R. Schlesiger, T. Yamamoto, D. Isheim, G. Schmitz, S. Matsumura, and J. Banhart,
Sr–Al–Si co-segregated regions in eutectic Si phase of Sr-modified Al–10Si alloy,
Ultramicroscopy, (2012) (in press)
doi:10.1016/j.ultramic.2012.10.006
125 Zoltán Balogh, Patrick Stender, Mohammed Reda Chellali, and Guido Schmitz,
Investigation of Interfaces by Atom Probe Tomography,
Metall. Mater. Trans. A (2012),
doi:10.1007/s11661-012-1517-6
124 Vladislav E. Demidov, Sergei Urazhdin, Henning Ulrichs, Vasyl Tiberkevich, Andrei Slavin, Dietmar Baither, Guido Schmitz, and Sergej O. Demokritov,
Magnetic nano-oscillator driven by pure spin current,
Nat. Mater. (2012),
doi:10.1038/nmat3459
123 F. Wunde, F. Berkemeier, and G. Schmitz,
Lithium diffusion in sputter-deposited Li4Ti5O12 thin films,
J. Power Sources 215, 109 (2012),
doi:10.1016/j.jpowsour.2012.04.102
122 Mohammed Reda Chellali, Zoltan Balogh, Houari Bouchikhaoui, Ralf Schlesiger, Patrick Stender, Lei Zheng, and Guido Schmitz,
Triple Junction Transport and the Impact of Grain Boundary Width in Nanocrystalline Cu,
Nano Lett. 12, 3448 (2012),
doi:10.1021/nl300751q
121 M. Timpel, N. Wanderka, R. Schlesiger, T. Yamamoto, N. Lazarev, D. Isheim, G. Schmitz, S. Matsumura, and J. Banhart,
The role of strontium in modifying aluminium-silicon alloys,
Acta Mater. 60, 3920 (2012),
doi:10.1016/j.actamat.2012.03.031
120 S. M. Eich, M. Kasprzak, A. Gusak, and G. Schmitz,
On the mechanism of diffusion-induced recrystallization: Comparison between experiment and molecular dynamics simulations,
Acta Mater. 60, 3469 (2012),
doi:10.1016/j.actamat.2012.03.009
119 H. Galinski, T. Ryll, L. Schlagenhauf, and L. J. Gauckler,
Patrick Stender and Guido Schmitz,
Hillock formation of Pt thin films on single-crystal yttria-stabilized zirconia,
Phys. Rev. B 85, 125408 (2012),
doi:10.1103/PhysRevB.85.125408
118 Z. Erdélyi and G. Schmitz,
Reactive diffusion and stresses in spherical geometry,
Acta Mater. 60, 1807 (2012),
doi:10.1016/j.actamat.2011.12.006
117 A. Stoffers, C. Oberdorfer, and G. Schmitz,
Controlled Field Evaporation of Fluorinated Self-Assembled Monolayers,
Langmuir 28, 56 (2012),
doi:10.1021/la204126x
116 G. Schmitz, D. Baither, Z. Balogh, M. R. Chellali, G.-H. Greiwe, M. Kasprzak, C. Oberdorfer, R. Schlesiger, and P. Stender,
Physics on the Top of the Tip: Atomic Transport and Reaction in Nano-Structured Materials,
Defect Diffus. Forum 323-325, 3 (2012),
doi:10.4028/www.scientific.net/DDF.323-325.3
115 A. M. Gusak, G. Schmitz, and N. V. Tyutyunnyk,
Flux Driven Nucleation at Interfaces during Reactive Diffusion – New Solution of an Old Problem,
Defect Diffus. Forum 323-325, 55 (2012),
doi:10.4028/www.scientific.net/DDF.323-325.55
114 T. Stockhoff, T. Gallasch, F. Berkemeier, and G. Schmitz,
Ion beam sputter-deposition of LiCoO2 films
Thin Solid Films 520, 3668 (2012),
doi:10.1016/j.tsf.2011.12.065
113 Lei Zheng, Guido Schmitz, Ye Meng, Reda Chellali, and Ralf Schlesiger,
Mechanism of Intermediate Temperature Embrittlement of Ni and Ni-based Superalloys,
Crit. Rev. Solid State Mater. Sci. 37, 181 (2012),
doi:10.1080/10408436.2011.613492

2010 - 2011
112 K. Hiepko, J. Bastek, R. Schlesiger, G. Schmitz, R. Wuerz, and N. A. Stolwijk,
Diffusion and incorporation of Cd in solar-grade Cu(In,Ga)Se2 layers,
Appl. Phys. Lett. 99, 234101 (2011),
doi:10.1063/1.3665036
111 L. Zheng, R. Schlesiger, R. M. Chellali, D. Baither, and G. Schmitz,
Investigation on the relationship between intermediate temperature embrittlement and intergranular precipitate in Ni(Bi) alloy,
Mater. Des. 34, 155 (2012),
doi:10.1016/j.matdes.2011.07.050
110 Z. Balogh, M. R. Chellali, G. Schmitz, and Z. Erdélyi,
Interface sharpening in miscible Ni/Cu multilayers studied by atom probe tomography,
Appl. Phys. Lett. 99, 181902 (2011),
doi:10.1063/1.3658390
109 L. Zheng, R. M. Chellali, R. Schlesiger, D. Baither, and G. Schmitz,
Intermediate temperature embrittlement in high-purity Ni and binary Ni(Bi) alloy,
Scr. Mater. 65, 428 (2011),
doi:10.1016/j.scriptamat.2011.05.024
108. M. R. Chellali, Z. Balogh, L. Zheng, and G. Schmitz,
Triple junction and grain boundary diffusion in the Ni/Cu system,
Scr. Mater. 65, 343 (2011),
doi:10.1016/j.scriptamat.2011.05.002
107. G. Schmitz, M. Kasprzak, and D. Baither,
Diffusion-Induced Recrystallization in Nickel/Palladium Multilayers,
Defect Diffus. Forum 309-310, 195 (2011),
doi:10.4028/www.scientific.net/DDF.309-310.195
106. A. M. Gusak, F. Hodaj, and G. Schmitz,
Flux-driven nucleation at interfaces during reactive diffusion,
Philos. Mag. Lett. 91, 610 (2011),
doi:10.1080/09500839.2011.600257
105. P. Stender, Z. Balogh, and G. Schmitz,
Triple junction segregation in nanocrystalline multilayers,
Phys. Rev. B 83, 121407(R) (2011),
doi:10.1103/PhysRevB.83.121407
104. J. Keller, D. Baither, U. Wilke, and G. Schmitz,
Mechanical properties of Pb-free SnAg solder joints,
Acta Mater. 59, 2731 (2011),
doi:10.1016/j.actamat.2011.01.012
103. A. Wedi, D. Baither, and G. Schmitz,
Contact angle and reactive wetting in the SnPb/Cu system,
Scr. Mater. 64, 689 (2010),
doi:10.1016/j.scriptamat.2010.12.026
102. M. Kasprzak, D. Baither, and G. Schmitz,
Diffusion-induced recrystallization in nickel/palladium multilayers,
Acta Mater. 59, 1734 (2011),
doi:10.1016/j.actamat.2010.11.040
101. B. Mazumder, A. Vella, M. Gilbert, B. Deconihout, and G. Schmitz,
Reneutralization time of surface silicon ions on a field emitter,
New J. Phys. 12, 113029 (2010),
doi:10.1088/1367-2630/12/11/113029
100. G. Schmitz, R. Abouzari, F. Berkemeier, T. Gallasch, G.-H. Greiwe, T. Stockhoff, and F. Wunde,
Nanoanalysis and Ion Conductivity of Thin Film Battery Materials,
Z. Phys. Chem. 224, 1975 (2010),
doi:10.1524/zpch.2010.0055
99. P. Stender, Z. Balogh, and G. Schmitz,
Triple line diffusion in nanocrystalline Fe/Cr and its impact on thermal stability,
Ultramicroscopy 111, 524 (2011),
doi:10.1016/j.ultramic.2010.10.021
98. G. Schmitz, C.-B. Ene, H. Galinski, R. Schlesiger, and P. Stender,
Nanoanalysis of interfacial chemistry,
JOM 62, 58 (2010),
doi:10.1007/s11837-010-0182-8
97. G. Schmitz, G.-H. Greiwe, C. Oberdorfer, and P. Stender,
Atom probe tomography of heterogeneous dielectric materials,
G. Solorzano and W. de Souza (eds.) ‘Proceedings of IMC 17’, Rio de Janeiro 2010, p. 310
96. T. Gallasch, T. Stockhoff, and G. Schmitz,
Ion beam sputter deposition of V2O5 thin films,
J. Power Sources 196, 428 (2011),
doi:10.1016/j.jpowsour.2010.06.099
95. C. Oberdorfer and G. Schmitz,
On the Field Evaporation Behavior of Dielectric Materials in Three-Dimensional Atom Probe: A Numeric Simulation,
Microsc. Microanal. 17, 15 (2011),
doi:10.1017/S1431927610093888
94. G. Schmitz, D. Baither, M. Kasprzak, T. H. Kim, and B. Kruse,
The hidden link between diffusion-induced recrystallization and ideal strength of metals,
Scr. Mater. 63, 484 (2010),
doi:10.1016/j.scriptamat.2010.05.011
93. R. Schlesiger, C. Oberdorfer, R. Würz, G.-H. Greiwe, P. Stender, M. Artmeier, P. Pelka, F. Spaleck, and G. Schmitz,
Design of a laser-assisted tomographic atom probe at Münster University,
Rev. Sci. Instrum. 81, 043703 (2010),
doi:10.1063/1.3378674
92. J. Görlich, D. Baither, and G. Schmitz,
Reaction kinetics of Ni/Sn soldering reaction,
Acta Mater. 58, 3187 (2010),
doi:10.1016/j.actamat.2010.01.027
91. C. Nowak, R. Kirchheim, and G. Schmitz,
Electric field effect on low temperature nanoscale oxidation,
Surf. Sci. 604, 641 (2010),
doi:10.1016/j.susc.2010.01.008
90. B. Kruse, D. Baither, and G. Schmitz,
Concentration characteristics of diffusion-induced recrystallization in Cu/CuAu multilayers of varying lattice mismatch,
Scr. Mater. 62, 144 (2010),
doi:10.1016/j.scriptamat.2009.10.012
89. J. Görlich, C. Oberdorfer, D. Baither, G. Schmitz, C. Reinke, and U. Wilke,
The role of oxide layers in solder joints,
J. Alloys Compd. 490, 336 (2010),
doi:10.1016/j.jallcom.2009.10.005

2005 - 2009
88. P. Adusumilli, D. Blavette, A. Cerezo, P. L. Flaitz, K. Hono, J. Juraszek, T. F. Kelly, D. J. Larson, L. J. Lauhon, D. Lawrence, E. A. Marquis, M. K. Miller, O. Nishikawa, J. A. Panitz, T. J. Prosa, S. P. Ringer, P. A. Ronsheim, G. Schmitz, G. D. W. Smith, and C. K. Sudbrack,
An Atom-Probe Tomography Primer,
MRS Bull. 34, 717 (2009),
doi:10.1557/mrs2009.194
87. S. V. Divinski, J. Ribbe, D. Baither, G. Schmitz, G. Reglitz, H. Rösner, K. Sato, Y. Estrin, and G. Wilde,
Nano- and micro-scale free volume in ultrafine grained Cu-1 wt.%Pb alloy deformed by equal channel angular pressing,
Acta Mater. 57, 5706 (2009),
doi:10.1016/j.actamat.2009.07.066
86. T. Gallasch, D. Baither, and G. Schmitz,
V2O5 thin film electrodes in rechargeable Li-ion batteries – Sample characterization by EELS,
in W. Grogger, F. Hofer, P. Pölt (Eds.): MC2009 3, 493 (2009),
doi:10.3217/978-3-85125-062-6-619
85. P. Stender and G. Schmitz,
Thermal stability of FeCr Multilayer – Interface width and triple line diffusion,
in W. Grogger, F. Hofer, P. Pölt (Eds.): MC2009 3, 57 (2009),
doi:10.3217/978-3-85125-062-6-401
84. O. Dzyapko, V. E. Demidov, M. Buchmeier, T. Stockhoff, G. Schmitz, G. A. Melkov, and S. O. Demokritov,
Excitation of two spatially separated Bose-Einstein condensates of magnons,
Phys. Rev. B 80, 060401(R) (2009),
doi:10.1103/PhysRevB.80.060401
83. M. R. Shoar Abouzari, F. Berkemeier, G. Schmitz, and D. Wilmer,
On the physical interpretation of constant phase elements,
Solid State Ionics 180, 922 (2009),
doi:10.1016/j.ssi.2009.04.002
82. J. Ribbe, D. Baither, G. Schmitz, and S. V. Divinski,
Network of porosity formed in ultrafine-grained copper produced by equal channel angular pressing,
Phys. Rev. Lett. 102, 165501 (2009),
doi:10.1103/PhysRevLett.102.165501
81. J. Ribbe, D. Baither, G. Schmitz, and S. V. Divinski,
Ultrafast diffusion and internal porosity in ultrafine-grained copper-lead alloy prepared by equal channel angular pressing,
Scr. Mater. 61, 129 (2009),
doi:10.1016/j.scriptamat.2009.03.029
80. J. Ribbe, G. Schmitz, Y. Estrin, and S. V. Dinvinski,
Grain boundary diffusion of Ni in ultra-fine grain copper-lead alloy produced by equal channel angular pressing,
Defect Diffus. Forum 289-292, 95 (2009),
doi:10.4028/www.scientific.net/DDF.289-292.95
79. J. Ribbe, G. Schmitz, and S. V. Divinski,
Grain boundary diffusion of Fe in high-purity copper,
Defect Diffus. Forum 289-292, 211 (2009),
doi:10.4028/www.scientific.net/DDF.289-292.211
78. G. Schmitz, B. Kruse, D. Baither, and T. H. Kim,
Concentration characteristics of diffusion-induced recrystallization,
Defect Diffus. Forum 289-292, 719 (2009),
doi:10.4028/www.scientific.net/DDF.289-292.719
77. G. Schmitz, C.-B. Ene, and C. Nowak,
Reactive diffusion in nanostructures of spherical symmetry,
Acta Mater. 57, 2673 (2009),
doi:10.1016/j.actamat.2009.02.021
76. M. Gruber, C. Oberdorfer, P. Stender, and G. Schmitz,
Laser-assisted Atom Probe Analysis of Sol-Gel Silica Layers,
Ultramicroscopy 109, 654 (2009),
doi:10.1016/j.ultramic.2008.12.005
75. V. E. Demidov, O. Dzyapko, M. Buchmeier, T. Stockhoff, G. Schmitz, G. A. Melkov, and S. O. Demokritov,
Magnon Kinetics and Bose-Einstein Condensation Studied in Phase Space,
Phys. Rev. Lett. 101, 257201 (2008),
doi:10.1103/PhysRevLett.101.257201
74. P. Stender, T. Heil, H. Kohl, and G. Schmitz,
Quantitative comparison of energy-filtering transmission electron microscopy and atom probe tomography,
Ultramicroscopy 109, 612 (2009),
doi:10.1016/j.ultramic.2008.12.009
73. C.-B. Ene, C. Nowak, C. Oberdorfer, and G. Schmitz,
Reactive diffusion under Laplace tension,
Ultramicroscopy 109, 660 (2009),
doi:10.1016/j.ultramic.2008.12.001
72. V. Vovk and G. Schmitz,
Thermal stability of a Co/Cu giant magnetoresistance (GMR) multilayer system,
Ultramicroscopy 109, 637 (2009),
doi:10.1016/j.ultramic.2008.11.026
71. R. Schlesiger and G. Schmitz,
A quantitative assessment of microelectrodes,
Ultramicroscopy 109, 497 (2009),
doi:10.1016/j.ultramic.2008.11.008
70. G. Schmitz,
Nanoanalysis by Atom Probe Tomography,
Nanotechnology, 213, Wiley-VCH, Weinheim 2010,
doi:10.1002/9783527628155.nanotech069
69. G. Schmitz, C.-B. Ene, H. Galinski, and V. Vovk,
Stability and reaction of magnetic sensor materials studied by atom probe tomography,
in S. Richter and A. Schwedt (eds.), 'EMC 2008', Springer Verlag, Berlin 2008, Volume II, p. 105,
doi:10.1007/978-3-540-85226-1_53
68. C.-B. Ene, C. Nowak, and G. Schmitz,
Reactive Diffusion under Laplace Tension in Spherical Nanostructures,
in S. Richter and A. Schwedt (eds.), 'EMC 2008', Springer Verlag, Berlin 2008, Volume II, p. 261,
doi:10.1007/978-3-540-85226-1_131
67. T. Heil, P. Stender, G. Schmitz, and H. Kohl,
Comparing Transmission Electron Microscopy (TEM) and Tomographic Atom Probe (TAP) through Measurements of Thin Multilayers,
in M. Luysberg, K. Tillmann, T. Weirich (eds.) 'EMC 2008', Springer Verlag, Berlin 2008, Volume I, p. 385,
doi:10.1007/978-3-540-85156-1_193
66. F. Berkemeier, M. R. Shoar Abouzari, and G. Schmitz,
Sputter-deposited network glasses: Structural and electrical properties,
Ionics 15, 241 (2009),
doi:10.1007/s11581-008-0266-4
65. J. Ribbe, G. Schmitz, Y. Amouyal, Y. Estrin, and S. V. Divinski,
Grain boundary radiotracer diffusion of Ni in ultra-fine grained Cu and Cu - 1wt.% Pb alloy produced by equal channel angular pressing,
Mater. Sci. Forum 584-586, 380 (2008),
doi:10.4028/www.scientific.net/MSF.584-586.380
64. P. Stender, C.-B. Ene, H. Galinski, and G. Schmitz,
Interface width of immiscible layered elements,
Int. J. Mater. Res. 99, 480 (2008),
doi:10.3139/146.101661
63. D. Baither, T. H. Kim, and G. Schmitz,
Diffusion-induced recrystallization in silver-palladium layers,
Scr. Mater. 58, 99 (2008),
doi:10.1016/j.scriptamat.2007.09.030
62. C.-B. Ene, C. Nowak, and G. Schmitz,
Stress impact on reactive diffusion in nano-structures of spherical symmetry,
Solid State Phenom. 138, 367 (2008),
doi:10.4028/3-908451-49-3.367
61. B. Sepiol, K. F. Ludwig, G. Schmitz, and J. M. Howe,
High Resolution Experimental Methods,
in W. Pfeiler (ed.) ‘Alloy Physics: A comprehensive Reference’, Wiley 2007,
doi:10.1002/9783527614196.ch13
60. T. Heil, P. Stender, G. Schmitz, and H. Kohl,
Comparing Transmission Electron Microscopy (TEM) and Tomographic Atom Probe (TAP) through Measurements of Thin Multilayers,
Microsc. Microanal. 13, 398 (2007),
doi:10.1017/S1431927607081998
59. G. Schmitz, C.-B. Ene, H. Galinski, and C. Oberdorfer,
Thermal stability and reaction of magnetic sensor materials,
Microsc. Microanal. 13, 1600 (2007),
doi:10.1017/S1431927607072169
58. F. Berkemeier, M. R. Shoar Abouzari, and G. Schmitz,
Thickness-dependent dc conductivity of lithium borate glasses,
Phys. Rev. B. 76, 024205 (2007),
doi:10.1063/10.1103/PhysRevB.76.024205
57. C. Oberdorfer, P. Stender, C. Reinke, and G. Schmitz,
Laser-assisted atom probe tomography of oxide materials,
Microsc. Microanal. 13, 342 (2007),
doi:10.1017/S1431927607070274
56. C.-B. Ene, G. Schmitz, T. Al-Kassab, and R. Kirchheim,
Solid state reaction in sandwich-type Al/Cu thin films,
Ultramicroscopy 107, 802 (2007),
doi:10.1016/j.ultramic.2007.02.012
55. P. Stender, C. Oberdorfer, M. Artmeier, P. Pelka, F. Spaleck, and G. Schmitz,
New tomographic atom probe at University of Muenster, Germany,
Ultramicroscopy 107, 726 (2007),
doi:10.1016/j.ultramic.2007.02.032
54. S. V. Divinski, J. Ribbe, G. Schmitz, and C. Herzig,
Grain boundary diffusion and segregation of Ni in Cu,
Acta Mater. 55, 3337 (2007),
doi:10.1016/j.actamat.2007.01.032
53. V. Vovk, G. Schmitz, A. Hütten, and S. Heitmann,
Mismatch-induced recrystallization of giant magneto-resistance (GMR) multilayer systems,
Acta Mater. 55, 3033 (2007),
doi:10.1016/j.actamat.2006.12.036
52. F. Berkemeier, M. Shoar Abouzari, and G. Schmitz,
Thickness dependent ion conductivity of lithium borate network glasses,
Appl. Phys. Lett. 11, 113110 (2007),
doi:10.1063/1.2713138
51. C.-B. Ene, G. Schmitz, R. Kirchheim, and A. Hütten,
Thermal reaction and stability of NiFe/Cu thin films investigated by atom probe tomography,
Surf. Interface Anal. 39, 227 (2007),
doi:10.1002/sia.2519
50. P. Stender and G. Schmitz,
New tomographic atom probe at University of Muenster, Germany,
19th Int. Vac. Nanoelectron. Conf. & 50th Int. Field Emiss. Symp. Tech. Dig.,
doi:10.1109/IVNC.2006.335334
49. C.-B. Ene, G. Schmitz, T. Al-Kassab, and R. Kirchheim,
Solid state reaction in sandwich type Al/Cu thin films,
19th Int. Vac. Nanoelectron. Conf. & 50th Int. Field Emiss. Symp. Tech. Dig.,
doi:10.1109/IVNC.2006.335348
48. G. Schmitz, C.-B. Ene, C. Lang, and V. Vovk,
Atom Probe Tomography: Studying Reactions on Top of the Tip,
Adv. Sci. Technol. 46, 126 (2006),
doi:10.4028/www.scientific.net/AST.46.126
47. C. Nowak, R. Kirchheim, and G. Schmitz,
Electric-field-induced low-temperature oxidation of tungsten nanowires,
Appl. Phys. Lett. 89, 143104 (2006),
doi:10.1063/1.2358203
46. V. Vovk, G. Schmitz, and A. Hütten,
Mismatch-induced recrystallization of giant magnet-resistance multilayer systems,
Appl. Phys. Lett. 88, 023120 (2006),
doi:10.1063/1.2163567
45. M. O. Pasichnyy, G. Schmitz, A. M. Gusak, and V. Vovk,
Application of the critical gradient concept to the nucleation of first-product phase in Co/Al thin films,
Phys. Rev. B 72, 014118 (2005),
doi:10.1103/PhysRevB.72.014118
44. C.-B. Ene, G. Schmitz, R. Kirchheim, and A. Hütten
Stability and thermal reaction of GMR NiFe/Cu thin films,
Acta Mater. 53, 3383 (2005),
doi:10.1016/j.actamat.2005.03.038
43. V. Vovk and G. Schmitz,
Nucleation and Growth during Early Stages of Reactive Diffusion,
Defect Diff. Forum 237-240, 837 (2005),
doi:10.4028/www.scientific.net/DDF.237-240.837
42. J. Görlich, G. Schmitz, and K. N. Tu,
On the mechanism of the binary Cu/Sn solder reaction,
Appl. Phys. Lett. 86, 053106 (2005),
doi:10.1063/1.1852724

2000-2004
41. M. Kuduz, G. Schmitz, and R. Kirchheim,
Investigation of oxide tunnel barriers by atom probe tomography (TAP),
Ultramicroscopy 101, 197 (2004),
doi:10.1016/j.ultramic.2004.06.003
40. V. Vovk, G. Schmitz, and R. Kirchheim,
Nucleation of product phase in reactive diffusion of Al/Co,
Phys. Rev. B 69, 104102 (2004),
doi:10.1103/PhysRevB.69.104102
39. V. Vovk, G. Schmitz, and R. Kirchheim,
Tree-dimensional atom probe investigation of Co/Al thin film reaction,
Microelectr. Eng. 70, 533 (2003),
doi:10.1016/S0167-9317(03)00460-X
38. C. Lang and G. Schmitz,
Microstructure-controlled interdiffusion of Cu/Co/Au thin films investigated by three-dimensional atom probe,
Mater. Sci. Eng. A 353, 119 (2003),
doi:10.1016/S0921-5093(02)00677-9
37. T. Jeske, M. Seibt, and G. Schmitz,
Microstructural influence on the early stages of interreaction of Al/Ni-investigated by TAP and HREM,
Mater. Sci. Eng. A 353, 105 (2003),
doi:10.1016/S0921-5093(02)00675-5
36. T. Al-Kassab, H. Wollenberger, G. Schmitz, and R. Kirchheim,
Tomography by atom probe field ion microscopy,
in F. Ernst, M. Rühle (eds.) 'High-Resolution Imaging and Spectrometry of Materials', Springer Verlag Berlin 2003
35. J. Pešicka and G. Schmitz,
The relation between the shape of the stress anomaly and the structure of Fe3Al alloys,
Intermetallics 10, 717 (2002),
doi:10.1016/S0966-9795(02)00045-6
34. P. Kesten, A. Pundt, G. Schmitz, M. Weisheit, H. U. Krebs, and R. Kirchheim,
H- and D-distribution in metallic multilayers studied by 3-dimensional atom probe analysis and secondary ion mass spectrometry,
J. Alloys Compd. 330-332, 225 (2002),
doi:10.1016/S0925-8388(01)01596-1
33. R. Lüke, G. Schmitz, T. B. Flanagan, and R. Kirchheim,
H-induced phase separation in Pd-Pt alloys as studied by high resolution electron microscopy,
J. Alloys Compd. 330-332, 219 (2002),
doi:10.1016/S0925-8388(01)01590-0
32. T. Jeske and G. Schmitz,
Influence of the microstructure on the interreaction of Ni/Al investigated by tomographic atom probe,
Mater. Sci. Eng. A 327, 101 (2002),
doi:10.1016/S0921-5093(01)01886-X
31. J. Schleiwies and G. Schmitz,
Thin film interreaction of Al/Ag analyzed by tomographic atom probe,
Mater. Sci. Eng. A 327, 94 (2002),
doi:10.1016/S0921-5093(01)01883-4
30. F. Hartung and G. Schmitz,
Interdiffusion and reaction of metals: The influence and relaxation of mismatch-induced stress,
Phys. Rev. B 64, 245418 (2001),
doi:10.1103/PhysRevB.64.245418
29. T. Jeske and G. Schmitz,
Nanoscale analysis of the early interreaction stages in Al/Ni,
Scr. Mater. 45, 555 (2001),
doi:10.1016/S1359-6462(01)01058-2
28. G. Schmitz, J. C. Ewert, F. Harbsmeier, M. Uhrmacher, and F. Haider,
Phase stability of decomposed Ni-Al alloys under ion irradiation,
Phys. Rev. B 63, 224113 (2001),
doi:10.1103/PhysRevB.63.224113
27. F. Hartung, P. J. Wilbrandt, and G. Schmitz,
Early stages of interdiffusion in Cu / Au multilayers,
Defect Diff. Forum 194-199, 1437 (2001),
doi:10.4028/www.scientific.net/DDF.194-199.1437
26. C. Lang, G. Schmitz, and R. Kirchheim,
Reactive Interdiffusion of Cu/Co/Au Thin-Film Couples Investigated by 3-Dimensional Atom-Probe,
Defect Diff. Forum 194-199, 1525 (2001),
doi:10.4028/www.scientific.net/DDF.194-199.1525
25. J. Schleiwies, G. Schmitz, S. Heitmann, and A. Hütten,
Nanoanalysis of Co/Cu/NiFe thin films by tomographic atom probe,
Appl. Phys. Lett. 78, 3439 (2001),
doi:10.1063/1.1374999
24. J. C. Ewert and G. Schmitz,
Reordering kinetics of ion-disordered Ni3Al,
Eur. Phys. J. B 17, 391 (2000),
doi:10.1007/s100510070118
23. G. Schmitz, F. Hartung, T. Jeske, C. Lang, and J. Schleiwies,
Interreaction of metals - The dominant influence of microstructure,
Adv. Solid State Phys. 40, 453 (2000),
doi:10.1007/BFb0108372
22. B. Färber, E. Cadel, A. Menand, G. Schmitz, and R. Kirchheim,
Phosphorus segregation in nanocrystalline Ni-3.6 at.% P alloy investigated with the tomographic atom probe (TAP),
Acta Mater. 48, 789 (2000),
doi:10.1016/S1359-6454(99)00397-3
21. P. Kratochvil, J. Kopecek, J. Pešicka, and G. Schmitz,
Effect of annealing at temperatures near B2-D03 transformation in Fe3Al-type alloy on the yield stress,
Intermetallics 8, 121 (2000),
doi:10.1016/S0966-9795(99)00074-6

1991 - 1999
20. P. Troche, J. Hoffmann, K. Heinemann, F. Hartung, G. Schmitz, H. C. Freyhardt, D. Rudolph, J. Thieme, and P. Guttmann,
Thermally driven shape instabilities of Nb/Cu multilayer structures: instability of Nb/Cu multilayers,
Thin Solid Films 353, 33 (1999),
doi:10.1016/S0040-6090(99)00365-X
19. G. Schmitz, J. C. Ewert, F. Haider, F. Harbsmeier, and M. Uhrmacher,
Disordering Kinetics of Ni3Al Precipitates under Ion Irradiation,
in Solid-Solid Phase Transformations JIM, 413 (1999)
18. G. Schmitz, O. Svenson, P. Troche, and F. Harbsmeier,
Interreaction of Al/Ag Thin Layers,
in Solid-Solid Phase Transformations JIM, 1283 (1999)
17. T. Jeske, G. Schmitz, and R. Kirchheim,
Atom probe field ion microscopy investigation of the early interreaction stages in Al/Ni couples,
Mater. Sci. Eng. A 270, 64 (1999),
doi:10.1016/S0921-5093(99)00230-0
16. R. Lüke, J. C. Ewert, G. Schmitz, and R. Kirchheim,
Influence of crystal orientation on oxygen analysis in NiO with energy dispersive X-ray analysis,
J. Microsc. 195, 1 (1999),
15. H. Voss, G. Schmitz, and F. Haider,
Precipitation and growth of the metastable phase ?' in Al-1 at.% Ag under cyclic deformation at elevated temperatures,
Philos. Mag. A 79, 423 (1999),
doi:10.1080/01418619908210307
14. G. Schmitz, J. C. Ewert, and F. Hartung,
Chemical analysis by high-angle hollow cone illumination,
Ultramicroscopy 77, 49 (1999),
doi:10.1016/S0304-3991(99)00007-8
13. J. C. Ewert, G. Schmitz, F. Harbsmeier, M. Uhrmacher, and F. Haider,
Ion induced disordering and dissolution of Ni3Al precipitates,
Appl. Phys. Lett. 73, 3363 (1998),
doi:10.1063/1.122770
12. F. Hartung, J. C. Ewert, J. Dzick, and G. Schmitz,
Interreaction of Cu/Au thin films observed by high angle hollow cone darkfield electron microscopy,
Scr. Mater. 39, 79 (1998),
doi:10.1016/S1359-6462(98)00135-3
11. G. Schmitz, P. Kesten, R. Kirchheim, and Q. M. Yang,
Diffusion of hydrogen through metallic multilayers,
Phys. Rev. B 58, 7333 (1998),
doi:10.1103/PhysRevB.58.7333
10. J. C. Ewert, F. Hartung, and G. Schmitz,
Measurement of interdiffusion by high angle hollow cone illumination,
Appl. Phys. Lett. 71, 1311 (1997),
doi:10.1063/1.119881
9. G. Schmitz and F. Haider,
Hollow cone dark field microscopy of GP zones in AlAg,
Scr. Mater. 37, 1951 (1997),
doi:10.1016/S1359-6462(97)00398-9
8. G. Schmitz, Q. M. Yang, P. Kesten, U. Geyer, U. V. Hülsen, K. Reimann, and R. Kirchheim,
Diffusion of hydrogen in metallic multilayers,
Defect Diff. Forum 143-147, 945 (1997),
doi:10.4028/www.scientific.net/DDF.143-147.945
7. Q. M. Yang, G. Schmitz, S. Fähler, H. U. Krebs, and R. Kirchheim,
Hydrogen in Pd/Nb multilayers,
Phys. Rev. B 54, 9131 (1996),
doi:10.1103/PhysRevB.54.9131
6. C. Borchers, F. Ernst, F. Haider, R. Hattenhauer, G. Schmitz, P.-J. Wilbrandt, and S.-Q. Xiao,
Investigation of decomposition processes by HREM and unconventional TEM,
Phys. Status Solidi A 146, 71 (1994),
doi:10.1002/pssa.2211460107
5. G. Schmitz, K. Hono, and P. Haasen,
High resolution electron microscopy of the early decomposition stage of AlLi alloys,
Acta Metall. Mater. 42, 201 (1994),
doi:10.1016/0956-7151(94)90063-9
4. R. Hattenhauer, G. Schmitz, P. J. Wilbrandt, and P. Haasen,
Z-Contrast TEM on Precipitates in AlAg,
Phys. Status Solidi A 137, 429 (1993),
doi:10.1002/pssa.2211370215
3. G. Schmitz and P. Haasen,
Phase Transformation and Order-Disorder in Al-Li observed by High Resolution Microscopy,
in A.R. Yavari, 'Ordering and Disordering in Alloys', 95, London (1992)
2. G. Schmitz and P. Haasen,
Decomposition of an AlLi Alloy-The early stages observed by HREM,
Acta Metall. Mater. 40, 2209 (1992),
doi:10.1016/0956-7151(92)90139-6
1. P. Haasen and G. Schmitz,
High Resolution Studies of the Decomposition of Al-7at%-Li
in K. Hirano, H. Oikawa and K. Ikeda, 'Science and Engineering of Light Metals', 19, JILM Tokyo (1991)


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