Technical Details
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In addition to the conventional SE- and BSE- detector systems the SEM is also equipped with a Centaurus BSE/CL-Imaging unit and an OXFORD INCA EDX- System. Image capturing is done by the analySIS-System.
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Applications
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Scanning electron microscopy is mainly used for
microstructural analysis as well as for qualitative elemental analysis of
micro-volumes with the addition of a x-ray or electron spectrometer. With a magnification of up to 10nm the Scanning electron microscope closures the gap between optical microscops and the transmission
electron microscope.
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Literature
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- Goldstein, J.I., Newbury, D.E., Echlin, P., Joy, D.C.,
Romig, A.D., Lyman, C.E., Fiori, C., and Lifshin, E. 1992. Scanning Electron
Microscopy and X-Ray Microanalysis. Plenum, New York.
- Potts, P.J., Bowles, J.F.W., Reed,
S.J.B., Cave, M.R. (Eds.) Microprone Techniques in the Earth Sciences.
The Mineralogical Society Series, 6, 1995, Chapmann & Hall.
- Reed, S.J.B. Electron Microprobe Analysis and Scanning Electron Microscopy in Geology. Cambridge University Press, 1996, 201pp.
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Links & Downloads
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Book SEM (WWU Muenster only)
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